The Direct Inlet Probe DIP module integrates with Agilent GC/MSD, GC/TQ, and GC-Q/TOF mass detectors

The SIM Direct Inlet Probe DIP module integrates with Agilent 5977 single quadrupole GC/MSD, 7000 and 7010 series triple quadrupole GC/TQ, and 7250 GC-Q-TOF mass spectrometers, allowing direct acquisition of mass spectra without disconnecting the GC/MS interface. 
A special probe is used to insert the sample into the vacuum of the ion source. 
A system of valves and pumps allows the sample to enter the vacuum of the MSD system by introducing a minimum amount of air. 
Once the probe is inserted, controlled heating of the sample begins, with programmable ramp rates. 
Spectral acquisition and evaluation (EI or CI mode) are performed by Agilent software.

DIP for single Agilent MSD 5975/5977 Quadrupoles:

  • Two different direct entry probes for liquid and solid samples
  • Automatic sample insertion into the high vacuum of the ion source (EI/CI)
  • No removal of the GC and GC/MS interface to perform mass spectrum acquisition, switching from MS-DIP to GC/MS and vice versa does not require venting the MSD
  • External controller for: valve, pumping system and probe tip heating/cooling
  • Complete solutions for Agilent MSD 5973/5975/5977 (optionally EI or CI)
  • Upgradable with CombiPal autosampler for automation and analysis of liquid and solid samples.

DIP for Agilent T-Q 7000/7000D/7010B Triple Quadrupoles:

  • Direct-entry probe for solid and low-volatility samples
  • No removal of the GC and GC/MS interface for mass spectral acquisition, switching between MS-DIP and GC/MS does not require venting the MSD
  • Data acquisition and evaluation with all the benefits of MS/MS analysis (high-speed MRM for complex samples)
  • External controller for: valve, pumping system, and probe tip heating/cooling management
  • Complete solutions for Agilent 7000/7000D/7010B Triple Quadrupoles
  • Upgradable with CombiPal autosampler for automation and analysis of liquid and solid samples.

DIP for Agilent 7200/7250 GC/Q-TOF systems:

  • Direct-entry probe even for solid and low-volatile samples
  • Automatic sample insertion into the high vacuum of the ion source (EI/CI)
  • Temperature-programmed evaporation in the ion source to eliminate matrix interferences
  • All the benefits of Q-TOF analysis: accurate mass information and resolution, high MS/MS sensitivity and selectivity Rapid screening for quality control, identification of unknown analytes, analysis of substances in complex matrices
  • Application areas include food and environmental analysis, metabolomics, analysis of natural substances
  • Direct mass analysis without removing the GC/Q-TOF interface, applied technology allows rapid switching between GC/MS and DIP/MS mode
  • Complete solutions for Agilent 7200/7250 GC/Q-TOF spectrometers.

SRA Instruments S.R.L.

Via alla Castellana, 3
20063 Cernusco sul Naviglio MI

Tel: +39 02.92.14.32.58
Fax: +39 02.92.47.09.01
Email: info@srainstruments.com